中国科学院新疆理化技术研究所机构知识库
Advanced  
XJIPC OpenIR  > 新疆维吾尔自治区电子信息材料与器件重点实验室  > 期刊论文
学科主题: Chemistry ; Materials Science ; Metallurgy & Metallurgical Engineering
题名: Effects of aging time of sol on the microstructure and electrical properties of (Pb0.5Ba0.5)ZrO3 thin films
作者: Hao Xihong; Wang Peng; An Shengli; Xu Jingbao; Yue Zhenxing
关键词: Thin films ; Crystal growth ; Crystal structure ; Electrical properties
刊名: Journal of Alloys and Compounds
发表日期: 2012
DOI: 10.1016/j.jallcom.2011.12.007
卷: 519, 期:5, 页:37-40
收录类别: SCI
摘要: In this work, (Pb0.5Ba0.5)ZrO3 (PBZ) thin films were prepared on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates after the starting sol was aged for 24, 192 and 528 h, respectively. The effects of aging time of sol on the microstructure and electrical properties of PBZ films were investigated systemically. The phase structure and surface micrograph of PBZ thin films were analyzed by X-ray diffraction (XRD) and atomic force microscopy (AFM), respectively. It was showed that all PBZ thin films had a pure cubic perovskite structure without obvious difference and that the surface roughness of films was decreased as the aging time of sol increasing. Electrical measurements illustrated that dielectric constant and dielectric loss of PBZ films were also gradually declined with the increase of aging time of sol. As a result, films with a longer aging time also had an improved figure of merit (FOM) value.
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.xjipc.cas.cn/handle/365002/1399
Appears in Collections:新疆维吾尔自治区电子信息材料与器件重点实验室_期刊论文

Files in This Item:
File Name/ File Size Content Type Version Access License
effects of aging time of sol on the microstructure and electrical properties of (pb0.5ba0.5)zro3 thin films.pdf(476KB)期刊论文作者接受稿开放获取View 联系获取全文

作者单位: Inner Mongolia Univ Sci & Technol, Sch Met & Mat, Baotou 014010, Peoples R China;Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Devices, Urumqi 830011, Peoples R China;Tsinghua Univ, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China

Recommended Citation:
Hao Xihong,Wang Peng,An Shengli,et al. Effects of aging time of sol on the microstructure and electrical properties of (Pb0.5Ba0.5)ZrO3 thin films[J]. Journal of Alloys and Compounds,2012,519(5):37-40.
Service
Recommend this item
Sava as my favorate item
Show this item's statistics
Export Endnote File
Google Scholar
Similar articles in Google Scholar
[Hao Xihong]'s Articles
[Wang Peng]'s Articles
[An Shengli]'s Articles
CSDL cross search
Similar articles in CSDL Cross Search
[Hao Xihong]‘s Articles
[Wang Peng]‘s Articles
[An Shengli]‘s Articles
Related Copyright Policies
Null
Social Bookmarking
Add to CiteULike Add to Connotea Add to Del.icio.us Add to Digg Add to Reddit
文件名: effects of aging time of sol on the microstructure and electrical properties of (pb0.5ba0.5)zro3 thin films.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 
评注功能仅针对注册用户开放,请您登录
您对该条目有什么异议,请填写以下表单,管理员会尽快联系您。
内 容:
Email:  *
单位:
验证码:   刷新
您在IR的使用过程中有什么好的想法或者建议可以反馈给我们。
标 题:
 *
内 容:
Email:  *
验证码:   刷新

Items in IR are protected by copyright, with all rights reserved, unless otherwise indicated.

 

 

Valid XHTML 1.0!
Powered by CSpace